Source Measure Units

Parameter Analyzers

Various models

available up to 300 V, 20 A, 100 W

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Variable models available

Package Level Test Systems


Used for assembled devices, high capacity, optimized for HC, TDDB, NBTI

Wafer Level Test Systems


For device characterization and WLR testing (HC, TDDB, NBTI, BTS, EM, ...), any number of SMUs and test outputs

Dreikreuzweg 8

8280 Fuerstenfeld


+43 (0)664-73522586



Ingenieurbuero für technische Physik GmbH