Multiple and independent experiments running in parallel
Internal execution of test programs including stop conditions
Excellent value for money
This test system has been designed for degradation testing of photo diodes. Each DUT is connected to a current source and is stressed by a user definecd current pattern. The voltage is monitored
continuously on all DUTs. The experiments runs as defined by the current pattern, but is stopped if an individual device shows a stop condition. Various stop conditions can be defined like
overvoltage, undervoltage or voltage step change. These checks are automatically executed in the test system. Each DUT use its own current source and voltmeter, so a short on one DUT does not
interfere with the other DUT's measurements.
The test system is available as standalone system (for use with an existing oven) or integrated in an oven. In the latter case the electronics is build into the backside of the oven without any
cabling to improve reliability.